Agentic AI turns simple language into self-guided X-ray scans of microelectronics

Researchers demonstrated an agentic AI platform that guides X-ray ptychography scans of microelectronics using natural language prompts. The system navigates samples, reconstructs images in real time, and triggers high-resolution scans of target areas. Engineers can direct beamline hardware without entering technical control commands or manually searching for microscopic features.

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